Why Polytec optical profilometers fit your surface metrology application
Our portfolio covers optical profilometers for a wide range of metrology tasks—from microscope-based systems for microstructures to macro and bench-top optical profilers for large-area form and quality inspection.Largest XYZ area sampling thanks to the broadest single-shot FoV and full usable Z-range.
· True Stitching extends measurement field to ~230 × 220 mm while achieving the highest accuracy
· Outstanding measurement precision reveals surface details down to 0.01 nm Z-resolution.
· Any-surface measurement with SST Smart Scanning Technology.
· Easy operation and automation-ready features & interfaces.
· Modular concept enables custom configurations and upgrades, expanding your capabilities.
· Long-term reliability due to rugged design and a 4-year warranty.